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Optimization of Single layer Antireflection Coating for Infra-Red Spectrum on Silicon Substrate for Solar Cell Applications

Sunil Kumar1

Section:Research Paper, Product Type: Journal Paper
Volume-07 , Issue-11 , Page no. 5-7, May-2019

Online published on Jun 15, 2019

Copyright © Sunil Kumar . This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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IEEE Style Citation: Sunil Kumar, “Optimization of Single layer Antireflection Coating for Infra-Red Spectrum on Silicon Substrate for Solar Cell Applications,” International Journal of Computer Sciences and Engineering, Vol.07, Issue.11, pp.5-7, 2019.

MLA Style Citation: Sunil Kumar "Optimization of Single layer Antireflection Coating for Infra-Red Spectrum on Silicon Substrate for Solar Cell Applications." International Journal of Computer Sciences and Engineering 07.11 (2019): 5-7.

APA Style Citation: Sunil Kumar, (2019). Optimization of Single layer Antireflection Coating for Infra-Red Spectrum on Silicon Substrate for Solar Cell Applications. International Journal of Computer Sciences and Engineering, 07(11), 5-7.

BibTex Style Citation:
@article{Kumar_2019,
author = {Sunil Kumar},
title = {Optimization of Single layer Antireflection Coating for Infra-Red Spectrum on Silicon Substrate for Solar Cell Applications},
journal = {International Journal of Computer Sciences and Engineering},
issue_date = {5 2019},
volume = {07},
Issue = {11},
month = {5},
year = {2019},
issn = {2347-2693},
pages = {5-7},
url = {https://www.ijcseonline.org/full_spl_paper_view.php?paper_id=1002},
publisher = {IJCSE, Indore, INDIA},
}

RIS Style Citation:
TY - JOUR
UR - https://www.ijcseonline.org/full_spl_paper_view.php?paper_id=1002
TI - Optimization of Single layer Antireflection Coating for Infra-Red Spectrum on Silicon Substrate for Solar Cell Applications
T2 - International Journal of Computer Sciences and Engineering
AU - Sunil Kumar
PY - 2019
DA - 2019/06/15
PB - IJCSE, Indore, INDIA
SP - 5-7
IS - 11
VL - 07
SN - 2347-2693
ER -

           

Abstract

Antireflection (AR) coatings are widely applied on optical devices for not only reducing the undesired reflection loss from the surfaces of the devices, but also for improving the contrast of the image of optical systems. Without the application of AR coatings on optical devices, the partial reflected light from the surfaces results in the formation of ghost images on the image plane, which reduces the contrast of the optical image. In general, the construction parameters of the optimal AR coating design for substrates with different refractive indices are different, thus the substrates should be coated in separate deposition runs. For saving time and reducing cost, this is of practical importance for a commercial thin-film coating shop if different substrates need to be AR-coated. The present work has been carried out to investigate the optimum values of reflectance as a function of wavelength in the infra-red region. The reflectance has been reduced from 32% of silicon surface to less than 1% using ARC film.

Key-Words / Index Term

AR Coating, Optimum value, Refractive indices, Substrate etc

References

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